SEQUENTIAL WAVELENGTH DISPERSIVE XRF SPECTROMETER FOR LARGE SAMPLES
Solids, liquids, powders, alloys, and thin films are all subjected to elemental analysis.
This WDXRF spectrometer is adjustable to various sample sizes and shapes utilising optional (made to order) adapter inserts, giving it the flexibility to adapt to your individual sample types and analytical demands. This very versatile instrument may drastically streamline your quality control operations with a changeable measuring spot (30 mm to 0.5 mm diameter, with 5-step automatic selection) and mapping capability with multi-point measurements to check for sample homogeneity.
The analysis region can be viewed within software using an optional real-time camera. What is being measured is completely clear to the operator.
This “big sample” variation retains all of the analytical capabilities of a traditional instrument. From solids to liquids, powders to thin films, use high-resolution, high-precision WDXRF spectroscopy to analyse beryllium (Be) through uranium (U). Analyze a wide variety of compositions (ppm to tens of percent) and thicknesses (less than a millimetre). For best results on single-crystal substrates, diffraction peak interference rejection is an option. The Rigaku ZSX Primus 400 wavelength dispersive X-ray fluorescence (WD-XRF) spectrometer is SEMI and CE compliant.