Phenom Pure G6 Desktop SEM

Desktop SEM that is economical and easy to use, with reliable automation features.

Phenom Pure Desktop SEM

The Thermo Scientific Phenom Pure Desktop Scanning Electron Microscope (SEM) is an ideal tool for the transition from light optical to electron microscopy. It is an economical solution for high-resolution imaging, providing the best imaging results in its class.

The Phenom Pure Desktop SEM provides high-quality images thanks to the long-lasting, high-brightness CeB6 source, and offers the market’s fastest loading and imaging time. The very reliable autofocus and automated source alignments make this the most user-friendly system on the market. 

Key Features

Never lost navigation

The user always knows the position on the sample with the unique never lost navigation. Overviews of both the optical and electron optical images provide clear reference points at all times. Thanks to the integrated motorized stage, you can navigate quickly through your sample.

Easy to use

Users are ready to take images after only 10 minutes of basic training. A large variety of sample holders is available to accommodate a large range of samples. Sample loading is fast and safe due to our patented sample vacuum loading technology.

Customize your SEM

The Phenom Pure Desktop SEM can be equipped with two optional detector systems.  The first one is a fully integrated energy dispersive spectroscopy (EDS) system. The second is a secondary electron detector (SED) for applications that require surface and topography sensitive imaging. 

 
 
 
 
 

Specifications

 
Light optical magnification
  • Fixed 27x
Electron optical magnification range
  • 160–175,000x
Resolution
  • ≤15 nm
Digital zoom
  • Max. 12x
Light optical navigation camera
  • Color
Acceleration voltages
  • Default: 5 kV and 10 kV
Vacuum modes
  • High-vacuum mode
  • Charge-reduction mode via optional low vacuum sample holder
Detector
  • Backscattered electron detector (standard)
  • Energy-dispersive X-ray spectroscopy detector (optional)
  • Secondary electron detector (optional)
Sample size
  • Up to 25 mm diameter
  • 32 mm (optional)
Sample height
  • Up to 35 mm
  • 100 mm (optional)
 
×