SEQUENTIAL WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER
Elemental analysis of solids, liquids, powders, alloys and thin films
Element analysis from Be to U.
Because of the small footprint, less valuable lab space is used.
Microanalysis is used to examine samples as small as 500 micrometres.
For liquids and loose powders, the tube-below configuration is ideal.
The light element performance of the 30 tube is superior.
For elemental topography/distribution, there is a mapping feature.
The optics are always under vacuum thanks to the helium seal.
The “Smart Sample Loading System” is now available (SSLS).
The ZSX Primus continues the history of delivering accurate findings in a rapid and smooth manner, with unmatched reliability, versatility, and ease of use to handle any laboratory issue.
The ZSX Primus incorporates a 30 micron tube, the narrowest end-window tube available in the industry, providing great light element (low-Z) detection limits and superior performance with the versatility to analyse the most complicated samples. The ZSX Primus, when combined with the most advanced mapping programme for detecting homogeneity and inclusions, provides for quick and easy thorough analysis of samples, yielding analytical insights not possible with conventional analytical procedures. Multi-spot analysis is also available, which aids in the elimination of sample mistakes in inhomogeneous materials.
Users can use EZ-scan to examine unknown materials without having to set up anything beforehand. This time-saving feature only involves a few mouse clicks and the input of a sample name. It gives the most precise and rapid XRF results when used in conjunction with SQX fundamental parameters software. SQX can compensate for all matrix effects, including line overlaps, automatically. SQX may also compensate for secondary excitation caused by photoelectrons (light and ultra-light elements), as well as variable atmospheres, contaminants, and sample sizes. The use of a matching library and precise scan analysis programmes improves accuracy.
Rigaku’s innovative Smart Sample Loading System (SSLS) gives the ZSX Primus WDXRF spectrometer a new level of versatility. A vacuum chuck can be used to load samples into pre-loaded sample holders for sample types that are suitable to such a process. This sample loading system has two big advantages: the operator saves time by not having to manually load each sample into a sample cup, and the number of samples that can be held on the sample deck is greatly enhanced.
Rigaku’s SSLS can handle samples up to 50 grams in weight and the modular sample deck racks have been designed for different sample diameters. Samples with a diameter of 35 mm can be stored 32 samples to a rack with three such racks sitting on the deck. Samples with a diameter of 40 mm can be stored 24 samples to a rack with a possibility of three of these racks on the deck. In addition, the racks can be mixed so that different sample sizes are easily accommodated on the deck at the same time. Sample types that are amenable to this type of loading procedure include fused glass beads and pressed powders. Both plastic and metal pressed powder holders are permitted.