Phenom ParticleX AM Desktop SEM

Desktop SEM for additive manufacturing analysis, capable of observing large samples up to 100 mm x 100 mm.

Additive manufacturing analysis

The Thermo Scientific Phenom ParticleX Desktop Scanning Electron Microscope (SEM) is a multi-purpose desktop SEM designed for additive manufacturing, delivering purity at the microscale.

It is equipped with a chamber large enough to analyze samples up to 100 mm x 100 mm. The proprietary venting and loading mechanism ensures the fastest vent/load cycle in the world, providing the highest throughput.

With the Phenom ParticleX AM Desktop SEM, you can take in-house control of your data:

  • Monitor critical characteristics of metal powders
  • Enhance your powder-bed and powder-fed additive manufacturing processes
  • Identify particle size distributions, individual particle morphology, and foreign particles

Phenom ParticleX AM Desktop SEM features

SEM particle analysis

The Phenom ParticleX AM Desktop SEM features a chamber with an accurate and fast motorized stage that allows analysis of samples of up to 100 mm x 100 mm. Even with this larger sample size, the proprietary loading shuttle keeps the vent/load cycle to an industry-leading loading time of 60 seconds or less, ultimately delivering faster throughput than other SEM systems.

Additive manufacturing testing

The Phenom ParticleX AM Desktop SEM measures various size and shape parameters, such as minimum and maximum diameter, perimeter, aspect ratio, roughness, and feret diameter. All of these can be displayed with 10%, 50%, or 90% values (i.e., d10, d50, d90).


SEM elemental mapping

The elemental mapping and line scan functionality lets you start working with a single click. The line scan functionality shows the quantified element distribution in a line plot. This is especially useful for analyzing edges, coatings, and cross sections of coatings, paints, and other samples with multiple layers.

Secondary electron detector

An optional secondary electron detector (SED) can be added to the Phenom ParticleX AM Desktop SEM. The SED collects low-energy electrons from the top surface layer of the sample, making it ideally suited to revealing detailed sample surface information. The SED can be of great use for studying microstructures, fibers, and particles or other applications where topography and morphology are important.