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A highly automated versatile X-ray diffraction (XRD) system, offers continued refinement of the ease-of-use features such as automatic alignment, component recognition, Cross Beam Optics and a 2D detector. Perhaps its most novel feature is the new SmartLab Studio II software, which provides the user with an intelligent User Guidance expert system functionality that guides the operator through the intricacies of each experiment. It is like having an expert standing by your side.


  • Available in-plane arm (5-axis goniometer)
  • High-flux X-ray source: PhotonMax
  • HyPix-3000 high energy resolution 2D HPAD detector
  • New CBO family, with fully automated beam switchable CBO-Auto
  • New CBO family, with high-resolution micro area CBO-μ
  • Operando measurements with SmartLab Studio II software
  • Multi-year component warranty contributes to low cost of ownership

XRD Engineered For Performance

This new X-ray diffraction system features the PhotonMax high-flux 9 kW rotating anode X-ray source coupled with a HyPix-3000 high-energy-resolution 2D multidimensional semiconductor detector that supports 0D, 1D and 2D measure­ment modes, allowing all applications to be handled with a single detector, eliminating the inconvenience of preparing and switching individual detectors for different applications. The HyPix-3000 detector can be used to obtain 2D powder diffraction patterns, which can be processed to deliver superior qualitative analysis by using all the 2D pattern information. The system incorporates a high-resolution θ/θ closed loop goniometer drive system with an available in-plane diffraction arm. The system’s new Cross-Beam-Optics (CBO) family feature fully automated switchable reflection and transmission optics (CBO-Auto).

Small angle X-ray scaXRD Designed For Usabilityttering (SAXS)

Coupling a computer controlled alignment system with a fully automated optical system, and the User Guidance functionality within the SmartLab Studio II software, makes it easy to switch between hardware modes, ensuring that your hardware complexity is never holding back your research.

XRD That Is Functionality Redefined

Whether you are working with thin films, nanomaterials, powders, or liquids the SmartLab will give you the XRD functionality to make the measurements you want to make when you want to make them. The equipment accepts powder, liquid, films, and even textile samples and allows mapping measurements within suitable samples. Operando (a.k.a., real time in-situ) measurements can be performed with the new Rigaku SmartLab Studio II software suite, which is an integrated software platform incorporating all functions from measurement to analysis. The system also features robust security and validation protocols to ensure that any technology component – software or hardware – fulfills its purpose within regulatory guidelines, including 21 CFR Part 11, establishing the US EDA regulations governing electronic records and electronic signatures (ER/ES).

Specifications Table

Product name



X-ray diffraction (XRD)


Powder diffraction, thin film, SAXS, in-plane scattering, operando measurements


Automated high-resolution θ-θ multipurpose X-ray diffractometer (XRD) with expert system Guidance software

Core attributes

3 kW sealed X-ray tube, CBO optics, D/teX Ultra 250 silicon strip detector

Core options

PhotonMax high-flux 9 kW rotating anode X-ray source, in-plane arm (5-axis goniometer), HyPix-3000 high energy resolution 2D HPAD detector, Johansson Kα₁ optics


External PC, MS Windows® OS, SmartLab Studio II software

Core dimensions

1300 (W) x 1880 (H) x 1300 (D) mm

Mass (core unit)

Approx. 750 kg (sealed tube) , 850 kg (rotating anode)

Power requirements

3Ø, 200 V 50/60 Hz, 30 A (sealed tube) or 60 A (rotating anode)


Secondary Monochromator

The optional secondary monochromator can be used with the D/teX Ultra 250 silicon strip detector for outstanding energy resolution. If the D/teX Ultra 250 is used in conjunction with the secondary monochromator an energy resolution of 320 eV is achieved, or 4% with CuKα.

RxRy Tilt Stage

Allows xy positioning of the sample in the X-ray beam. 20 mm, 50 mm, and 75 mm translations available.

Mapping Stage

Allows xy positioning of the sample in the X-ray beam. 20 mm, 50 mm, and 75 mm translations available.

D/teX Ultra 250 HE

The D/teX Ultra 250 HE is a special silicon strip detector that is optimized for high energy X-ray work by utilizing a thicker detector material. For Cr, Fe, Co, and Cu, the efficiency is approximately 99%. With Mo radiation the efficiency is approximately 70%.

D/teX Ultra 250

The D/tex Ultra 250 is a 1D silicon strip detector that decreases data acquisition time by almost 50% compared to competitive detectors. This is achieved by increasing the active area of the aperture and thus increasing the count rate. Compared to the previous model, the D/teX Ultra, has a smaller pixel pitch (0.075mm) and is longer in the direction of 2θ. For researchers who are interested in the lowest XRF suppression possible, the combination of an optional receiving monochromator and low-enrgy discrimination offer outstanding suppression.

Simultaneous XRD and DSC

Simultaneous collection of XRD and DSC data eliminates the uncertainty of separate measurements. With the addition of a humidity generator, the XRD-DSC system provides the ability to study crystalline-amorphous and amorphous-amorphous changes at constant temperature and variable humidity or variable humidity at constant temperature.

  • Enables simultaneous characterization of dehydration, polymorphic phase transitions, melting, crystallization, and decomposition of geological samples
  • Distinguishes exothermic and endothermic reactions and provides their enthalpies and temperatures
  • Probes the effects of temperature history and heat treatment on structural and thermal properties
  • Requires only milligrams of sample
  • Humidity attachment for hydration studies

HyPix-3000 Hybrid Pixel Array Detector

2D semiconductor detector with large active area (approx. 3000 mm²), small pixel size (100 μm²), ultra-high dynamic range, high sensitivity, and XRF suppression by high and low energy discrimination. Seamless switching from 2D-TDI (Time Delay and Integration) mode to 2D snapshot mode to 1D-TDI mode to 0D mode with a single detector.

with Pt-strip: 25 °C to 1600 °C in air, vacuum
with Ta and C-strip: 25 °C to 1500 °C in vacuum

Atmospheres: air, inert gas, vacuum(10⁻⁴ mbar)