Phenom ParticleX TC Desktop SEM

Component cleanliness analysis with a multi-purpose desktop SEM.

Desktop SEM for component cleanliness analysis

The Thermo Scientific Phenom ParticleX TC Desktop SEM is a multi-purpose desktop SEM enabling technical cleanliness at the microscale.

Materials characterization

A versatile solution for high-quality, in-house analysis, the Phenom ParticleX Desktop SEM gives you the ability to carry out speedy characterization, verification and classification of materials, supporting your production with fast, accurate and trusted data. The system is simple to operate and fast to learn, opening up particle and material analysis to a wider group of users.

Key Features

Technical cleanliness

With the growing demand for analysis of smaller particles beyond the scope of light microscopy within (automotive) industries, the Phenom ParticleX TC (Technical Cleanliness) Desktop SEM enables automated scanning electron microscopy with energy-dispersive X-ray spectroscopy (EDS). This is a major advantage over light microscopy as it enables chemical classification of the particles, providing great insights in your production processes and/or environments. Standard reports compliant with VDA 19 / ISO 16232 or ISO 4406/4407 are available.

Secondary electron detector

A secondary electron detector (SED) is optionally available on the Phenom ParticleX TC (Technical Cleanliness) Desktop SEM. The SED collects low-energy electrons from the top surface layer of the sample. It is therefore the perfect choice to reveal detailed sample surface information. The SED can be of great use for applications where topography and morphology are important. This is often the case when studying microstructures, fibers or particles.

General SEM usage

The user interface is based on the proven ease-of-use technology applied in the successful Phenom desktop SEM products. The interface enables both existing and new users to quickly become familiar with the system with a minimum of training.

Elemental mapping and line scan

For a user, it is simply click and go to work with the elemental mapping and line scan functionality of the Phenom ParticleX TC (Technical Cleanliness) Desktop SEM. The line scan functionality shows the quantified element distribution in a line plot.

Specifications

Electron optical	Long lifetime thermionic source (CeB₆ ) Multiple beam currents
Electron optical magnification range	160 – 200,000x
Light optical magnification	3–16x
Resolution	<10 nm
Image resolution options	960 x 600, 1920 x 1200, 3840 x 2400 and 7680 x 4800 pixels
Acceleration voltages	Default: 5 kV, 10 kV and 15 kV Advanced mode: adjustable range between 4.8 kV and 20.5 kV imaging and analysis mode
Vacuum levels	Low – medium – high
Detector	Backscattered electron detector (standard) Energy-dispersive X-ray spectroscopy (EDS) detector (standard) Secondary electron detector (optional)
Sample size	Max. 100 mm x 100 mm (up to 36 x 12 mm pin stubs) Max. 40 mm (h)
Sample loading time	Light optical <5 s Electron optical <60 s