NANOPIX

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SMALL ANGLE AND WIDE ANGLE X-RAY SCATTERING INSTRUMENT SYSTEM

Advanced SAXS/WAXS for nanostructure analysis

Features

  • Easy to use operability
  • Applicable to variety of specimens such as polymers, liquid crystals, gels, nanoparticles as well as proteins and biopolymers.
  • High-power point focus X-ray source
  • OptiSAXS high-performance multilayer optics
  • HyPix-3000 high-performance 2D HPAD detector
  • Superior small angle resolution (Qmin to 0.02 nm-1)

NANOPIX

Rigaku NANOPIX SAXS/WAXS measurement system is a new X-ray scattering instrument designed for nano-structure analyses. NANOPIX can be used for both small angle scattering (SAXS) and wide angle scattering (WAXS) measurements, which makes it possible to evaluate multi-scale structures from sub-nanometer to nano-order (0.1 nm to 100 nm). It achieves the highest level of small angle resolution (Qmin to 0.02 nm-1) for a laboratory SAXS instrument.

Small angle X-ray scattering (SAXS)

SAXS is a technique used to study nano-scale structures of atoms or molecules as well as their non-uniformity by measuring the diffuse scattering from unequal electron density areas.

SAXS/WAXS measurements for many applications

NANOPIX SAXS/WAXS measurement system is applicable to a variety of materials, such as: solids, liquids, liquid-crystals, or gels (with ordered and disordered structures). Diverse applications include: nano-particle size distribution analyses, three-dimensional protein molecule structure analyses, identification of molecular assembly or disassembly, and research of advanced materials, such as carbon fiber-reinforced plastics (CFRP).

Ultra high performance SAXS/WAXS design

Rigaku NANOPIX SAXS/WAXS measurement system is configured with a high-brilliance, high-power point focus X-ray source, the OptiSAXS high-performance multilayer mirror, the Clear Pinhole high-performance, low scattering pinhole slits, and the HyPix-3000 high-performance 2D semiconductor detector that enables detecting diffraction and scattering even from anisotropic materials. Optionally, the HyPix-6000 detector is also available for wide angle measurements, offering an expanded detection area by combining two detection modules.

SAXS/WAXS with broad experimental range

NANOPIX enables measurements under various temperature or humidity conditions, experiments with simultaneous DSC (differential scanning calorimetry) measurements, as well as measurements in combination with special attachments or other external devices.

Specifications Table

Product name

NANOPIX

Technique

Small angle and wide angle X-ray scattering

Benefit

Advanced SAXS/WAXS for nanostructure analysis

Technology

High-flux X-ray instrument for SAXS/WAXS

Core attributes

Powerful X-ray source with OptiSAXS optics and HPC detector

Core options

GI SAXS, DSC, Temperature and humidity control

Computer

External PC, MS Windows® OS, NANOPIX Guidance, 2DP, SAXS 1D

Accessories

GI-SAXS/GI-WAXS

Grazing-Incidence SAXS (GI-SAXS) is a unique tool for characterizing the nanostructural features of materials at surface and interface.

Tensile

DSC is widely used for the determination of thermodynamical states (cf. phase transition, melt/crystallization). Simultaneous measurement of SAXS(WAXS) and DSC is configured.

Differential Scanning Calorimetry (DSC)

In-situ SAXS and WAXS measurement is a powerful tool for investigating the dynamic behaviors of polymer morphology, phase transition during drawing.

Temperature and humidity

Temperature and humidity control unit is a key device for advanced functional materials in the fuel cell, etc.

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