ZSX Primus III+


Solids, liquids, powders, alloys, and thin films are all subjected to elemental analysis.


  • Element analysis from O to U.
  • Contamination is reduced by placing the tube above the optics.
  • Because of the small footprint, less valuable lab space is used.
  • Sample placement with extreme precision.
  • Curved sample surfaces generate mistakes, which are reduced by special optics.
  • Controlling statistical processes with software (SPC).
  • Throughput can be improved by optimising evacuation and vacuum leak rates.

Tube above optics for superior reliability

ZSX Primus III+ features an innovative optics-above configuration. Never again worry about a contaminated beam path or down time due to sample chamber maintenance. The optics-above geometry eliminates cleaning worries and increases up time.

High precision sample positioning

The high precision positioning of the sample ensures that the distance between the sample surface and X-ray tube is kept constant. This is important for applications that require high precision, such as the analysis of alloys. ZSX Primus III+ performs high-precision analysis using a unique optical configuration designed to minimize errors caused by non-flat surfaces in samples such as fused beads and pressed pellets

SQX fundamental parameters with EZ-scan software

EZ-scan allows users to analyze unknown samples without any prior setup. This time saving feature requires only a few clicks of the mouse and a sample name to be entered. Combined with SQX fundamental parameters software, it provides the most accurate and rapid XRF results possible. SQX is capable of automatically correcting for all matrix effects, including line overlaps. SQX can also correct for secondary excitation effect by photoelectrons (light and ultra-light elements), varying atmospheres, impurities and different sample sizes. Increased accuracy is achieved using matching library and perfect scan analysis programs.