Determine Oxygen, Hydrogen, and Nitrogen in Inorganic Samples
The inert gas fusion technique is used to measure the oxygen, nitrogen, and hydrogen content of inorganic materials, ferrous and nonferrous alloys, and refractory materials with the ONH836 Oxygen/Nitrogen/Hydrogen Elemental Analyzer. Automation and our Cornerstone® brand touch-screen software work together to make your analysis go faster, while a solid design ensures durability.
Rigaku NANOPIX SAXS/WAXS measurement system is a new X-ray scattering instrument designed for nano-structure analyses. NANOPIX can be used for both small angle scattering (SAXS) and wide angle scattering (WAXS) measurements, which makes it possible to evaluate multi-scale structures from sub-nanometer to nano-order (0.1 nm to 100 nm). It achieves the highest level of small angle resolution (Qmin to 0.02 nm-1) for a laboratory SAXS instrument.
SAXS is a technique used to study nano-scale structures of atoms or molecules as well as their non-uniformity by measuring the diffuse scattering from unequal electron density areas.
NANOPIX SAXS/WAXS measurement system is applicable to a variety of materials, such as: solids, liquids, liquid-crystals, or gels (with ordered and disordered structures). Diverse applications include: nano-particle size distribution analyses, three-dimensional protein molecule structure analyses, identification of molecular assembly or disassembly, and research of advanced materials, such as carbon fiber-reinforced plastics (CFRP).
Rigaku NANOPIX SAXS/WAXS measurement system is configured with a high-brilliance, high-power point focus X-ray source, the OptiSAXS high-performance multilayer mirror, the Clear Pinhole high-performance, low scattering pinhole slits, and the HyPix-3000 high-performance 2D semiconductor detector that enables detecting diffraction and scattering even from anisotropic materials. Optionally, the HyPix-6000 detector is also available for wide angle measurements, offering an expanded detection area by combining two detection modules.
NANOPIX enables measurements under various temperature or humidity conditions, experiments with simultaneous DSC (differential scanning calorimetry) measurements, as well as measurements in combination with special attachments or other external devices.
Small angle and wide angle X-ray scattering
Advanced SAXS/WAXS for nanostructure analysis
High-flux X-ray instrument for SAXS/WAXS
Powerful X-ray source with OptiSAXS optics and HPC detector
GI SAXS, DSC, Temperature and humidity control
External PC, MS Windows® OS, NANOPIX Guidance, 2DP, SAXS 1D
Grazing-Incidence SAXS (GI-SAXS) is a unique tool for characterizing the nanostructural features of materials at surface and interface.
DSC is widely used for the determination of thermodynamical states (cf. phase transition, melt/crystallization). Simultaneous measurement of SAXS(WAXS) and DSC is configured.
In-situ SAXS and WAXS measurement is a powerful tool for investigating the dynamic behaviors of polymer morphology, phase transition during drawing.
Temperature and humidity control unit is a key device for advanced functional materials in the fuel cell, etc.