LEXT™ OLS5100 3D Laser Scanning Microscope
The MX63 and MX63L microscope systems are designed to inspect wafers up to 300 mm in diameter, flat panel displays, circuit boards, and other big samples in high-quality. Because of its modular architecture, you may pick and choose which components you need to customise the system for your needs.
These ergonomic and user-friendly microscopes enable inspectors operate more efficiently while remaining comfortable. Your entire workflow, from observation to report preparation, can be streamlined when OLYMPUS Stream image analysis software is used.
Designed to suit the ergonomic and safety requirements of the electronics industry, with enhanced analysis capabilities.
Microscope objectives from LEXT provide extremely accurate measurement data. When used in conjunction with the Smart Lens Advisor, you can obtain reliable data that you can trust.