Automated Multipurpose X-ray Diffractometer
The SmartLab SE is a multipurpose X-ray Diffractometer with built-in intelligent guiding that is extremely adaptable. Powder diffraction, thin film diffraction, SAXS, pole figure, residual stress, and non-ambient experiments are all possible with it.
• Fully automated measurement, including optics and sample alignment, is provided by integrated Intelligent guiding software.
• The SmartLab Studio II software includes an X-ray diffraction suite that is flexible and integrated.
• Without changing optics, the cross-beam optics module shifts between Bragg-Brentano and parallel beam.
• SmartLab SE offers two cutting-edge detectors: the entry-level D/teX Ultra 250 high-speed 1 D silicon strip X-ray detector and the high-end HyPix-400 2 D semiconductor hybrid pixel array detector.
Powder diffraction, small angle X-ray scattering, residual stress and mapping, and other applications are supported by SmartLab SE. When switching between complex setups, it selects the optimal optics and performs an automatic alignment, which is a unique Rigaku feature and the only true way to verify that your instrument is ready to capture the high-quality data that your research requires.
The new SmartLab Studio II software was designed from the ground up to be simple to use. It includes an integrated modular X-ray diffraction suite that includes measurement, analysis, data display, and reporting, as well as the complete spectrum of activities required for X-ray diffraction investigation.
Rigaku NANOPIX SAXS/WAXS measurement system is a new X-ray scattering instrument designed for nano-structure analyses. NANOPIX can be used for both small angle scattering (SAXS) and wide angle scattering (WAXS) measurements, which makes it possible to evaluate multi-scale structures from sub-nanometer to nano-order (0.1 nm to 100 nm). It achieves the highest level of small angle resolution (Qmin to 0.02 nm-1) for a laboratory SAXS instrument.
When the Cross Beam Optics are combined with completely automated optical and sample alignments, switching geometries is simple and quick.
Rigaku’s large array of attachments can be used to provide automatic sample change, sample spinning and orientation, temperature or humidity control, and more.
SmartLab SE offers two cutting-edge detectors: the entry-level D/teX Ultra 250 high-speed 1 D silicon strip X-ray detector and the high-end HyPix-400 2 D semiconductor hybrid pixel array detector. The HyPix-400 not only works in 2 D mode, but also in 0/1 D mode, allowing for a wider range of applications. With its huge active area, excellent angular resolution, and ultra-high dynamic range, it’s the ideal, cost-effective 2D detector for a wide range of applications, including powder and thin film diffraction.
NANOPIX enables measurements under various temperature or humidity conditions, experiments with simultaneous DSC (differential scanning calorimetry) measurements, as well as measurements in combination with special attachments or other external devices.
Small angle and wide angle X-ray scattering
Advanced SAXS/WAXS for nanostructure analysis
High-flux X-ray instrument for SAXS/WAXS
Powerful X-ray source with OptiSAXS optics and HPC detector
GI SAXS, DSC, Temperature and humidity control
External PC, MS Windows® OS, NANOPIX Guidance, 2DP, SAXS 1D
Grazing-Incidence SAXS (GI-SAXS) is a unique tool for characterizing the nanostructural features of materials at surface and interface.
DSC is widely used for the determination of thermodynamical states (cf. phase transition, melt/crystallization). Simultaneous measurement of SAXS(WAXS) and DSC is configured.
In-situ SAXS and WAXS measurement is a powerful tool for investigating the dynamic behaviors of polymer morphology, phase transition during drawing.
Temperature and humidity control unit is a key device for advanced functional materials in the fuel cell, etc.