TUBE-ABOVE SIMULTANEOUS WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER
Elemental analysis of solids, powders, and alloys at high throughput.
In practically any sample matrix, analyse beryllium (Be) through uranium (U). Precision, accuracy, and sample throughput are the most critical criteria for automated process control. Simultix 15 provides unsurpassed analytical speed and sensitivity with up to 30 (and possibly 40) discrete and optimised elemental channels and 4 kW (or optionally 3 kW) of X-ray tube power. This instrument is the ideal elemental analysis metrology tool, thanks to its powerful but user-friendly software, which includes substantial data reduction capabilities and maintenance functionality.
Automation is an absolute must for high-throughput applications. A 48-position Automatic Sample Changer can be added to the Rigaku Simultix 15 WDXRF spectrometer (ASC). The Sample Loading Unit, which is available as an option, allows right or left side belt-in input from a third-party sample preparation automation system for complete automation.
In contrast to the more common sequential WDXRF apparatus, which analyses elements one by one using a scanning goniometer with an analysing crystal changing mechanism, simultaneous WDXRF accelerates the measurement process. Each Rigaku Simultix 15 XRF spectrometer is tailored to your specific elemental analysis needs, with distinct, optimised fixed channels for the elements of interest. All channels measure at the same moment since there are no moving components, time delays, or compromises. Simultaneous WDXRF is the best solution in terms of time-to-result, precision, dependability, low cost-per-analysis, and instrument longevity. For increased flexibility, Simultix 15 wavelength dispersive X-ray fluorescence spectrometers can be fitted with a scanning goniometer for element analysis and XRD channels for phase analysis.