Nano-inXider

Smart Nanoscale Characterization

Achieve next-generation insight with a fully integrated solution for real-time, high-precision nanostructure analysis. The Xeuss Pro delivers accurate, high dynamic range measurements with exceptional ease, enabling researchers to go from sample to result — faster and smarter.

🔹 Directly from Samples to Results

Streamlined workflow with intuitive software and automation reduces user intervention. Go from raw sample to fully processed data with minimal steps, ideal for high-throughput and routine analysis.

🔹 Unrivaled Accuracy & Dynamic Range

Capture structural information across a broad intensity spectrum, ensuring precise quantification of weak and strong scattering features — even in complex multi-phase systems.

🔹 Atomic- to Nano-Scale Data in One Measurement

Simultaneously access SAXS, WAXS, GISAXS, and optional USAXS data from a single setup, revealing a comprehensive view of material organization from Ångström to micron scales.

🔹 Low Cost of Ownership

Designed for long-term reliability and minimal maintenance, with robust components and remote diagnostics. Enjoy industry-leading uptime and reduced total cost over the instrument’s lifetime.

Xeuss Pro is more than an instrument — it’s a smart companion for advanced nanomaterials research, built to maximize insight, minimize effort, and support innovation across disciplines.

From Sample to Results — Instantly

Nano-inXider SMART brings simplicity and speed to nanostructure characterization. With its fully integrated, automated design, getting high-quality data is as easy as placing your sample in the chamber — no manual alignment, no complex setup.

🔹 Sample

Simply place your sample.
The instrument takes care of the rest. Featuring a fully motorized, auto-aligning system, Nano-inXider SMART eliminates the need for user calibration or alignment.

🔹 Measurement

Fast, automatic data acquisition.
The workflow is entirely automated. Thanks to a fixed dual-detector configuration, X-ray scattering data is captured and automatically normalized, with no user calibration required. The result: fast, reproducible measurements — every time.

🔹 Analysis

Insight in real time.
Get instant access to accurate scattering data for immediate feedback or in-depth interpretation. The integrated XSACT software offers a broad range of analysis tools, allowing you to extract nanostructure parameters with just a few clicks.

🔹 Report

Publication-ready results at your fingertips.
XSACT generates high-quality, exportable graphs and figures that are ready for publication or further reporting. Simply drag and drop into your documents or save for later use.

Nano-inXider SMART — the perfect balance of automation, accuracy, and accessibility for fast, confident nanoscale analysis.