ZSX Primus 400

Rigaku ZSX Primus II delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards.

  • Analysis of elements from Be to U
  • Tube above optics minimizes contamination issues
  • Small footprint uses less valuable lab space
  • Micro analysis to analyze samples as small as 500 µm
  • 30μ tube delivers superior light element performance
  • Mapping feature for elemental topography/distribution
  • Helium seal means the optics are always under vacuum


Tube above optics for superior reliability

ZSX Primus II features an innovative optics-above configuration. Never again worry about a contaminated beam path or down time due to sample chamber maintenance. The optics-above geometry eliminates cleaning worries and increases up time.

Low-Z performance with mapping and multi-spot analysis

Providing superior performance with the flexibility for analyzing the most complex samples, the ZSX Primus II features a 30 micron tube, the thinnest end-window tube available in the industry, for exceptional light element (low-Z) detection limits. Combined with the most advanced mapping package to detect homogeneity and inclusions, the ZSX Primus II allows easy detailed investigation of samples that provide analytical insights not easily obtained by other analytical methodologies. Available multi-spot analysis also helps to eliminate sampling errors in inhomogeneous materials.

SQX fundamental parameters with EZ-scan software

EZ-scan allows users to analyze unknown samples without any prior setup. This time saving feature requires only a few clicks of the mouse and a sample name to be entered. Combined with SQX fundamental parameters software, it provides the most accurate and rapid XRF results possible. SQX is capable of automatically correcting for all matrix effects, including line overlaps. SQX can also correct for secondary excitation effect by photoelectrons (light and ultra-light elements), varying atmospheres, impurities and different sample sizes. Increased accuracy is achieved using matching library and perfect scan analysis programs.


Elemental coverage ₄Be through ₉₂U
Optics Wavelength dispersive, sequential, tube above
X-ray generator
X-ray tube End window, Rh-anode, 3kW or 4 kW, 60kV
HV power supply High frequency inverter, ultra-high stability
Cooling Internal water-to-water heat exchanger
Sample changer 48 positions standard, 96 optional
Sample inlet APC automatic pressure controller
Maximum sample size 51 mm (diameter) by 30 mm (high)
Sample rotation speed 30 rpm
Primary X-ray filters Al25, Al125, Ni40 and Ni400
Beam collimators 6 auto-selectable diameters: 35, 30, 20, 10, 1 and 0.5 mm
Divergence slit 3 auto-selectable: standard, high, and coarse (optional) resolutions
Receiving slit For SC and for F-PC detectors
Goniometer θ – 2θ independent drive mechanism
Angular range SC: 5-118°, F-PC: 13-148°
Angular reproducibility Ultra-high precision
Continuous scan 0.1 – 240°/min
Crystal changer 10 crystals, automatic mechanism
Vacuum system 2 pump high-speed system w/ (optional) powder trap
He flush system Optional, with partition
Detector systems
Heavy element detector Scintillation counter (SC)
Light element detector Flow proportional counter (F-PC)
Attenuator In-out automatic exchanger (1/10)


There are no reviews yet.

Be the first to review “ZSX Primus 400”

Your email address will not be published. Required fields are marked *