The TTRAX III is the world’s most powerful diffractometer. Utilizing an 18 kW rotating anode X-ray source in a θ/θ geometry provides the perfect system for demanding applications. Both thin film diffraction and the determination of trace phases in powdered samples benefit greatly from the TTRAX’s high powered source.


  • In-plane diffraction arm for in-plane measurements without reconfiguration.
  • World’s most powerful diffractometer utilizing an 18 kW rotating anode X-ray source.
  • Highest sensitivity for measuring trace phases
  • θ/θ geometry for horizontal sample mounting.
  • Focusing and parallel beam geometries without reconfiguration.
  • High resolution optics.
  • SAXS capabilities.
Engineered for Versatility

The TTRAX incorporates both Cross Beam Optical technology (CBO) and an independent in-plane scattering axis to provide the widest possible range of measurement geometries without the need for system reconfiguration. Experimental capabilities include standard powder diffraction, glancing incidence diffraction, in-plane diffraction, high resolution diffraction, X-ray reflectivity, and small angle X-ray scattering (SAXS). The TTRAX III can be configured with a wide range of optional attachments for maximum flexibility.


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