Rigaku NANOPIX SAXS/WAXS measurement system is a new X-ray scattering instrument designed for nano-structure analyses. NANOPIX can be used for both small angle scattering (SAXS) and wide angle scattering (WAXS) measurements, which makes it possible to evaluate multi-scale structures from sub-nanometer to nano-order (0.1 nm to 100 nm). It achieves the highest level of small angle resolution (Qmin to 0.02 nm-1) for a laboratory SAXS instrument.


Small angle X-ray scattering (SAXS)

Small angle X-ray scattering (SAXS) is a technique used to study nano-scale structures of atoms or molecules as well as their non-uniformity by measuring the diffuse scattering from unequal electron density areas. SAXS experiments are performed in a wide range of fields from R&D to quality control.

SAXS/WAXS measurements for many applications

NANOPIX SAXS/WAXS measurement system is applicable to a variety of materials, such as: solids, liquids, liquid-crystals, or gels (with ordered and disordered structures). Diverse applications include: nano-particle size distribution analyses, three-dimensional protein molecule structure analyses, identification of molecular assembly or disassembly, and research of advanced materials, such as carbon fiber-reinforced plastics (CFRP).

Ultra high performance SAXS/WAXS design

Rigaku NANOPIX SAXS/WAXS measurement system is configured with a high-brilliance, high-power point focus X-ray source, the OptiSAXS high-performance multilayer mirror, the ClearPinhole high-performance, low scattering pinhole slits, and the HyPix-3000 high-performance 2D semiconductor detector that enables detecting diffraction and scattering even from anisotropic materials. Optionally, the HyPix-6000 detector is also available for wide angle measurements, offering an expanded detection area by combining two detection modules. As one of the features, the sample-to-detector distance is changeable depending on the structure size ranging from atomic structure (micro-structures: 0.2 – 1 nm) to molecular structure (macro-structures: 1 – 100 nm).

SAXS/WAXS with broad experimental range

NANOPIX enables measurements under various temperature or humidity conditions, experiments with simultaneous DSC (differential scanning calorimetry) measurements, as well as measurements in combination with special attachments or other external devices. Control of the measurement environment is indispensable for the research of structure-property relationships of functional materials.


X-ray source (Microfocus rotating anode X-ray generator)
FR-X MicroMax-007 HF MR
Brilliance 67.3 kW/mm2 31.0 kW/mm2
Source size φ70 µm φ70 µm
X-ray power 2.97 kW 1.2 kW
Voltage/Current 45 kV 66 mA 40 kV 30 mA
Beam units
Confocal optics Confocal Max-Flux for Cu
Collimation Pinhole configuration
2 pinhole / 3 pinhole selectable
Sample holder and stage
GI-SAXS attachment TZ, Ry and Rx axis (3 axis stage)
TZ, Ry, Rx and Φ axis (4 axis stage)
Rapid heating and cooling temperature control attachment Temperature control range: -150°C ~ 400°C
Peltier temperature control attachment Temperature control range: -10°C ~ 120°C*
Multipurpose attachment Linkam temperature control stage series
Linkam tensile control stage series
Linkam shear control stage series
Metter hot-stage series
Vacuum attachment Vacuum chamber for vacuum cell
Multipurpose vacuum attachment Vacuum chamber for multipurpose measurement
Temperature and Humidity attachment Temperature: RT ~ 80°C, Humidity: 90% RH
SAXS-DSC attachment Heat-Flux type DSC, -50°C ~ 300°C
Tensile attachment Manual tensile machine

* Temperature range of stage depends on conditions such as environmental temperature.

Base stage
Base YZ stage Horizontal direction: ±35 mm
Vertical direction: ±25 mm
Withstand load < 5 kg
Mounting Kinematic base
Digital telescope camera for sample (Option)
CCD camera
Detector (2D Hybrid Pixel Array Detector)
HyPix-3000 HyPix-6000
Sensors Semiconductor pixel sensor
Active area 2984 mm2 5968 mm2
Number of pixels 775 x 385 pixels 775 x 770 pixels
Pixel size 100 μm x 100 μm
Global count rate >2.9 x 1011 (1 x 106 cps/pixel)
Internal counter bit Max 31-bit/pixel (Normal 16-bit/pixel)
Energy range 5.4 keV ~ 30 keV
Energy resolution Better than 25% at CuKα
 Readout time 3.7 ms (0 ms for zero dead time mode)
Detector stage Horizontal /Vertical direction ±100 mm
Power supply
Power 3φ AC 200 ±10% 50/60 Hz
Power consumption 13 A 4.5 kW
Grounding resistance Earth resistance ≤ 100 Ω


There are no reviews yet.

Be the first to review “NANOPIX”

Your email address will not be published. Required fields are marked *